QE49
The QE-49 IEEE1149.1 Boundary Scan Trainer Kit was developed by Qmax to provide user a good understanding and hands on the testing principals of boundary scan namely the scan chain test, interconnect test, non-BS functional testing of logic IC and cluster like a combinational or sequential circuits.
QT25
QT65
QT55
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions. Functional Test is basic testing technique deployed in testing active components in a board by driving inputs then to compare the outputs with that of a verified one. This technique is used in out circuit as well as in in-circuit testing of components in a board. Both digital and analog devices on board can be tested and the testing techniques can be illustrated with the help of software provided. Graphical view of test vectors enables the trainers to explain the testing phenomenon in a device testing with the logic levels. Easy to use graphical user interface with windows OS leads the trainees to use effectively. Vast library of devices to test is useful to practice more and gain a better knowledge with the device data sheets presented. QT65,Functional Test Trainer System, useful in testing SSI /MSI devices in digital and Analog and mixed signal devices including linear devices on board.
Signature Method of Testing is also known as VI Trace Characteristics, is a proven fault diagnostics technique in Power-Off state while testing a board. By applying known wave from signal with desired Voltage, Source impedance and Frequency of the stimulus signals, depending upon the test node and its characteristics, a Voltage (V) vs Current (I) graph is plotted and studied. V-I Signature method is safe while testing components because the signatures are acquired without applying power to the board / device under test. More importantly, the Signature method can be used to test components even on a damaged PCB, which cannot be powered up for testing. The trainer system also helps to plot Voltage vs Time and Voltage vs Impedance characteristics of the node under test in a board. Analyzing and comparing signatures obtained can lead to find faults in a board such as; • Leaky components • Damaged components (Internally) • Intermittent behavior of device with frequency Short/Open circuits in board interconnections Graphical representation a quick to understand the phenomenon, will be an useful methodology for the student to learn the component/nodal characteristics and troubleshoot.